Product Introduction:

This instrument is a device that integrates atomic force microscopy, optical microscopy, and laser Raman spectroscopy, seamlessly combining the technologies of the three. Atomic force microscopy and Raman spectroscopy can be used to characterize and analyze the surface morphology, particle size, roughness, and Raman spectroscopic properties of nanomaterials, providing more comprehensive information about the sample and sharp microscopic images. This integration can improve users' work efficiency, allowing them to spend more time on data collection and analysis without worrying about tedious instrument operations, truly achieving in-situ detection and analysis of samples.

characteristic:

1.Integrated design of optical microscope, atomic force microscope and Raman spectrometer, with powerful functions

2.Simultaneously possessing imaging capabilities of optical microscope, atomic force microscope, and Raman spectroscopy analysis, without affecting each other

3.Simultaneously equipped with optical two-dimensional measurement and atomic force microscope three-dimensional measurement functions

4.The laser detection head and sample scanning table are integrated into one, with a very stable structure and strong anti-interference ability

5.Precision probe positioning device, laser spot alignment adjustment is very simple

6.Single axis drive sample automatically approaches the probe vertically, scanning the needle tip perpendicular to the sample

7.Intelligent needle insertion method for motor controlled automatic detection of piezoelectric ceramics, protecting probes and samples

8.Ultra high magnification optical positioning system, achieving precise positioning of probe and sample scanning areas

9.Integrated scanner non-linear correction user editor, with superior nano characterization and measurement accuracy98%

10.Three Raman spectrometer detection modules with different wavelengths can be inserted simultaneously, and switching between different spectrometers can be performed on the software,

11.Fast and automatic detection of multi wavelength Raman spectroscopy can be achieved.

12.Can support405nm、532nm、633nm、785nm、830nm、1064nmWaiting for multiple wavelengths

technical parameter